Keithley 2868 Nanomix free download

File name 2868 Nanomix.pdf

A GREAT ER M EA SU R E O F C O N F I D E N C E alized, the packaged devices are exposed to target analytes, and their detection charac- teristics analyzed. Wafer Level Testing In wafer level testing, Id-Vd and Id-Vg measurements are taken at various stages of production. The tests are conducted on ac- tual devices and special test structures. The test equipment includes a semi-automatic prober, Keithley Model 2400 SourceMeter